Sem microscopy

Taking care of the highest standard of services we want to offer material analysis using scanning electron microscopy (SEM). With the PRO X from Phenom World company we are able to analyse most of the available materials (also without sample metal coating). We are able to take pictures of structures and perform chemical composition analysis using EDS detector*.

  • electron mode magnification range to 100 000x**
  • optical mode magnification 20-135x
  • maximum resolution 17 nm**
  • multiple acceleration voltages (5, 10 and 15 kV)
  • EDS detector
  • image formats: JPEG, TIFF, BMP

*with the limitation of EDS detection for elements
**depends on sample type and preparation

For more details please contact with Sales Manager [email protected]